| 02208 Test of integrated circuits |
| Danish title: Test af integrerede kredsløb |
|
Language: English ECTS-creditpoints: 10, External examination.
|
|
| Type: , course at phd level, open university |
|
Exam schedule:
|
F4-A (jun 04 2002), E4-A (dec 18 2001) |
Scope and form: Lectures.
1 weekly problem solving session.
2 written assignments with oral presentation (compulsory). |
Evaluation: Oral exam
Approval of compulsory activities is a prerequisite for taking part in the examination. |
| Examination: 13-scale |
| Prerequisites: 02200 / 02206 |
| Aim: Introduction to the testing problem for integrated circuits, enabling the participants to design integrated circuits of high test quality. |
Contents: The course treats the fundamental theory for test of electronic circuits with specific emphasis on the design of highly testable digital integrated circuits.
The course covers the topics of:
- physical failure mechanisms and logic fault models,
- testability analysis (controllability and observability),
- algorithms for test pattern generation,
- test evaluation (fault coverage) and fault sampling,
- design for test and test of special design structures,
- testability at board level,
- test planning in the design phase,
- commercial test systems, test and measurement equipment. |
| Contact: Flemming Stassen, building 322, (+45) 4525 3753, stassen@imm.dtu.dk |
| Department: 002 Informatics and Mathematical Modelling |
| Course URL: http://www.imm.dtu.dk/courses/02208 |
| Keywords: physical failure mechanisms for IC's, logic fault models, test pattern generation (TPG), design for test (DFT) |
| Updated: 23-08-2001 |
|
|
