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10455 Electron Microscopy and Microanalysis
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Danish title: Elektronmikroskopi og mikroanalyse
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| Type: Å, Language: EEE |
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Credit points:
5 point |
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| | | Previous course: C1848 |
| Offered by:
Department of Physics
(FYS) |
| No credit points with: C1848 |
| Prerequisite: 45030/C1013/C1508/10008/C4053/45030. C3300/80251/C3301/ C1505/10005/C5301/53316. C1201/C1202/10100 |
| Recommended semester:
4th -7th semester |
| Limitation: Max. 20 |
| Scope and form: 2 lecture modules per week and a total of 4 afternoons with laboratory work and demonstrations. |
| Examination:
Written exam
(13 point scale
) |
| Contact person: |
Leif Gerward, FYS, Building 307, Tel. +45 4525 3146 |
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| Aim: Electron microscopy has become an increasingly used method for analysis. Examples can be found in investigation of materials (e.g. metals, polymers, fibres, wood, paper, concrete, ceramics, semiconductors) and within geology, physics, chemistry, biochemistry, biology, medicine etc. The objective is to teach the student how to handle modern electron microscopes and to make specimens and evaluate the micrographs. |
| Contents: 1) Resolution of optical microscopes and electron microscopes. 2) Principle and layout for transmission and scanning electron microscopes. 3) Electron diffraction crystalline and amorphous materials. Kinematical and dynamical theory of contrast from different lattice defects, e.g. dislocations. 4) Investigation of surfaces with the help of scanning electron microscopy. Depth of focus, signal to noise ratio contrast, resolution etc. 5) Special methods of analysis: Elemental analysis by means of x-rays, energy loss, cathodoluminescence, contrast due to electric and magnetic fields etc. |
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