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| Offered by:
Department of Applied Electronics
(IAE) |
| No credit points with: D4262 |
| Prerequisite: 92003 |
| Recommended semester:
5th semester |
| Scope and form: Class lectures. |
| Examination:
Written exam
(13 point scale
) |
| Contact person: |
Birgitte Yde, IAE, Building 451, Tel. +45 4525 5252 |
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Aim: The objective of the course is to enable the student to:
- appreciate the development engineers task in developing reliable and dependable devices
- develop robust devices
- analyse failure patterns for equipment containing electronics
- evaluate the physical origins of failures, aiming to improve the dependability
- perform prediction of electronic systems reliability and anticipate potential failure mechanisms |
Contents: Reliability techniques and quality control. Lifetimes models for electronic components and systems. The "bathtub" curve of hazard rate. Repairable systems reliability. Load-strength inferences and derating. Analysis of tolerances in relation to process capability and parameter drift in the useful life period. The Taguchi tolerance concept. Elementary physical failure mechanisms for electronic components. Wearout, degradation and robustness. Failure mode effects analysis and fault tree analysis. Failure rate predictions.
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