| |
| Previous course: C4470 |
| Offered by:
Mikroelektronik Centret
(MIC) |
| No credit points with: C4470 |
| Prerequisite: 10207/C1204.21010/C2010/10004/C1504/10005/C1505 |
| Recommended semester:
6th or 7th semester |
| Scope and form: Experimental work for 3 weeks 8 hours a day. |
| Examination:
Evaluation of report(s)
(
pass/fail
) |
| Contact person: |
Ole Hansen, MIC, Building 345ø, Tel. +45 4525 5715 |
|
| Aim: To Introduce the student to modern semiconductor characterization methods for the evaluation of chemical, mechanical, electrical, and optical properties of semiconductor materials and devices. |
| Contents: One or several experiments under the following headings: Chemical analysis of semiconductor heterostructures using Secondary Ion Mass Spectrometry; Electrical characterization of semiconductors using I-V, C-V; DLTS and Life Time Measurements; Characterization of integrated optics components measuring refractive indices, loss, fiber coupling efficiences; Photoluminescence and -reflectance measurements of semiconductor heterostructures and quantum wells; Mechanical properties of micromechanical structures and components including resonanting systems. |
