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44420 Scanning Probe Microscopy
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Danish title: Scanning probe microscopy
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| Type: Å, Language: EEE |
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Credit points:
5 point |
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| Offered by:
Mikroelektronik Centret
(MIC) |
| Desirable: 10002 Mekanisk og fysisk modellering/10013 Elektromagnetisme |
| Recommended semester:
4th semester |
| Limitation: Max. 16 |
| Scope and form: Lectures followed with experimental exercises |
| Examination:
Approval of report
(13 point scale
) |
| Contact person: |
Anja Boisen, MIC, Building 345Ø, Tel. +45 4525 5727
Sergey Bozhevolni, MIC, Building 345Ø, Tel. +45 4525 5763
Ulrich Quaade, MIC, Building 345Ø, Tel. +45 4525 5735 |
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| Aim: The course will give the student a general introduction to scanning probe microscopy (SPM), with the focus on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). The main goal of the project is to give the student an overview of the strenght and the limitations of the microscope technologies as well as a basic understanding of the principle of operation. |
| Contents: First, a general introduction to scanning probe microscopy will be given. Next, three series of lectures will treat STM, AFM and SNOM in more detail. The basic physical principles behind the three measurement methods will be described. Therafter a wide range of examples of SPM applications in science will be described. Topical research projects at MIC will be included. Typical experimental problems will be discussed in order to give the student the necessary skills for operating the microscopes and for interpreting the microscope images. The last part of the course is an experimental session, where the students will have the opportunity to work with one of the microscopes. The experimental part is completed by the submission of a report. |
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