DTU
Uddannelse
Previous page | Current version Archive 1999/2000 
 
92705 Reliability Evaluation of Electronics
Danish title: Pålidelighedsvurdering af elektronikdesign
Language: English Credit points: 5
Type: Open University
Language: English

Prerequisite: 92003
Recommended semester: 7th - 9th semester
Scope and form: 1 lecture per week and one weekly session at class working with test planning, analysis, and reports. In addition to that laboratory work as necessary, homework, 1-2 company visits are planned.
Examination: Evaluation of 3-4 reports and at the end of the course a verbal examination starting from the reports (13-scale)
Remarks: The course will as far as possible be cooperated with Danish electronic companies, who are invited to supply parts and/or assemblies for test objects.
Contact person: Lars Rimestad, Building 451

Department: Department of Applied Electronics
Aim: Before an electronic/mechatronic product is released for the market it is an important task for the company to evaluate the reliability of the product. The aim of this course is to enable the participants to:
· Work with evaluation of product reliability in a development, production, or test- & reliability department of an electronics company.
· Evaluate, both under accelerating and standard operation conditions, the physical mechanisms most influential on the failure development in components and systems.
· Plan and execute lifetests, wear-out tests and robustness tests and analyse the results.
· Predict an expected lifetime with respect to a single failure mechanism and to guage the prediction accuracy.
· Participate in a development team and supply knowledge on the development of dependable and robust designs
Contents: - Design of reliable constructions and evaluation of potential failure modes, FMEA
- Loadtypes and failure mechanisms.
- F(t)-analysis for complete and censored datasets. Modelfitting and confidence.
- Testplans and sample size allocation.
- Models for acceleration of failures and graphical relationsship plots.
- Life predictions, random overloads and robustness testing.
- Verification tests versus failure producing tests (HALT, Strife & step-stress tests)